Self-heating effect in lateral DMOS on SOI

IEEE International Symposium on Power Semiconductor Devices & ICs (ISPSD)

Volumn , Issue , 1995, Pages 136-140

  Leung, Ying Keung ^a   Suzuki, Yuji ^a   Goodson, Kenneth E ^a   Wong, S Simon ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC FIELDS; HEAT RESISTANCE; POWER ELECTRONICS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; SILICON ON INSULATOR TECHNOLOGY; THERMAL CONDUCTIVITY OF SOLIDS;

SELF HEATING EFFECT;

MOS DEVICES;

EID: 0029179067     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)