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Volumn , Issue , 1995, Pages 181-185
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Variable entrance slit system for precision spectrophotometers
a
a
CSEM
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
ARRAYS;
MACHINE COMPONENTS;
MICROMACHINING;
OPTIMIZATION;
PHOTODIODES;
SEMICONDUCTING SILICON;
SENSITIVITY ANALYSIS;
SPECTROPHOTOMETERS;
STEPPING MOTORS;
DIODE ARRAY DETECTION;
DOUBLE SYMMETRICAL STRUCTURE;
MILLIMETER LONG LINEAR DISPLACEMENTS;
VARIABLE ENTRANCE SLIT SYSTEM;
MICROELECTROMECHANICAL DEVICES;
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EID: 0029178743
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (1)
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References (5)
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