High-resolution atomic-force microscopy of DNA: the pitch of the double helix

FEBS Letters

Volumn 371, Issue 3, 1995, Pages 279-282

  Mou, Jianxun ^a   Czajkowsky, Daniel M ^a   Zhang, Yiyi ^a   Shao, Zhifeng ^a  

^a UNIVERSITY OF VIRGINIA   (United States)

Author keywords

Atomic force microscopy (AFM); Bilayer; DNA; Double helix; Resolution

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; DNA STRUCTURE; PRIORITY JOURNAL;

DNA; DNA, BACTERIAL; MEMBRANES, ARTIFICIAL; MICROSCOPY, ATOMIC FORCE; NUCLEIC ACID CONFORMATION; REPRODUCIBILITY OF RESULTS; SUPPORT, U.S. GOV'T, NON-P.H.S.; SUPPORT, U.S. GOV'T, P.H.S.;

EID: 0029127492     PISSN: 00145793     EISSN: None     Source Type: Journal    
DOI: 10.1016/0014-5793(95)00906-P     Document Type: Article

References (36)