Optical surface analysis of the head-disk-interface of thin film disks

Journal of Tribology

Volumn 117, Issue 1, 1995, Pages 112-118

  Meeks, Steven W ^a   Weresin, Walter E ^a   Rosen, Hal J ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; INTERFACES (MATERIALS); LUBRICANTS; OPTICAL MICROSCOPY; OPTICAL VARIABLES MEASUREMENT; REFLECTOMETERS; SURFACE ROUGHNESS; THIN FILMS; WEAR OF MATERIALS;

DEBRIS GENERATION; HEAD DISK INTERFACE; LUBRICANT ACCUMULATION; LUBRICANT DEPLETION; OPTICAL INDEX CHANGE; OPTICAL SURFACE ANALYZER;

DISKS (MACHINE COMPONENTS);

INSTRUMENTS; LUBRICANT MONITORING;

EID: 0029104565     PISSN: 07424787     EISSN: 15288897     Source Type: Journal    
DOI: 10.1115/1.2830584     Document Type: Article

References (13)

1. Assam, R. A., and Bashara, N. M., 1976, EUipsometry and Polarized Light, North-Holland Publishing Co., Amsterdam, The Netherlands.
2. Baumgartner, H., and Liess, H. D., 1988, “Micro Kelvin Probe for Local Work-function Measurement,” Rev. Sci. Instrum., Vol. 59, p. 802.
3. Benninghoven, A., Rudenauer, F. G., and Werner, H. W., 1987, Secondary Ion Mass Spectrometry, Wiley, New York.
4. Bright, D. S., and Marinenko, R. B., 1992, “Concentration Histogram Imaging: A Quantitative View of Related Images,” Microscopy: The Key Research Tool, Vol. 22, p. 21.
5. Butz, R., and Wagner, H., 1977, “A Device for Measuring Contact Potential Differences with High Spatial Resolution,” Appl. Phys., Vol. 13, p. 37.
6. Church, E. L., and Zavada, J. M., 1975, “Residual Surface Roughness of Diamond-turned Optics,” Applied Optics, Vol. 14, p. 1788.
7. Jen, D., and Gillis, D., 1992, “Optical Profiler for Thin Film Disk,” Adv. Info. Storage Sys., Vol. 4, pp. 219-230.
8. Mate, C. M., and Novotny, V. J., 1991, “Molecular Conformation and Disjoining Pressure of Polymeric Liquid Films,” J. Chem. Phys., Vol. 94, p. 8420.
9. Novotny, V. J., 1990, “Migration of Liquid Polymers on Solid Surfaces,” J. Chem. Phys., Vol. 92, p. 3189.
10. Rudge, V., William E., 1993, IBM Internal software entitled “h2d.”
11. Spiller, E., 1994, Soft X-Ray Optics, SPIE Optical Engineering Press, Bellingham, WA, p. 134.
12. Yee, S., Kanazawa, K., and Sonnenfeld, R., 1993, “Simultaneous Distance and Potential Servo for the Scanning Kelvin Probe,” Proceeding of the 1993 Electrochemical Society, Honolulu, HI.
13. Yee, S., Stratmann, M., and Oriani, R. A., 1991, “Application of a Kelvin Microprobe to the Corrosion of Metals in Humid Atmospheres,” J. Electro-chem. Soc., Vol. 138, p. 55