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Volumn 17, Issue 3, 1995, Pages 175-185

Scanning electron microscopy 1928–1965

Author keywords

history; imaging of solid samples; scanning electron microscopy

Indexed keywords

ARTICLE; ELECTRON BEAM; HISTORY; IMAGING SYSTEM; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SOLID; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0029070038     PISSN: 01610457     EISSN: 19328745     Source Type: Journal    
DOI: 10.1002/sca.4950170309     Document Type: Article
Times cited : (135)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.