Surface mass spectrometry - application to biosensor characterization

Biosensors and Bioelectronics

Volumn 10, Issue 9-10, 1995, Pages 885-894

  Hagenhoff, Birgit ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; INTERFACES (MATERIALS); ION BEAMS; LASER APPLICATIONS; MASS SPECTROMETRY; MOLECULAR STRUCTURE; SECONDARY ION MASS SPECTROMETRY; SURFACE TREATMENT; SURFACES;

FINGERPRINT SPECTRA; LASER POSTIONIZATION OF SPUTTERED NEUTRALS; MATRIX ASSISTED LASER DESORPTION; POLYMER MOLECULES; RASTERING; SACCHARIDES; SURFACE MASS SPECTROMETRY; TIME-OF-FLIGHT ANALYSERS;

BIOSENSORS;

BIOSENSOR; CONFERENCE PAPER; MASS SPECTROMETRY;

EID: 0028789664     PISSN: 09565663     EISSN: None     Source Type: Journal    
DOI: 10.1016/0956-5663(95)99226-B     Document Type: Article

References (24)

1. Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline Targets
2. Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline Targets
3. A time-of-flight mass spectrometer for static SIMS applications
4. Design and performance of a reflectron based time-of-flight secondary ion mass spectrometer with electrodynamic primary ion mass separation