Photoamperic probes in scanning tunneling microscopy

Applied Physics Letters

Volumn 64, Issue 10, 1994, Pages 1207-1209

  Prins, M W J ^a   Van Der Wielen, M C M M ^a   Jansen, R ^a   Abraham, D L ^a   Van Kempen, H ^a  

^a RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; IRRADIATION; LASER APPLICATIONS; PROBES; SCANNING TUNNELING MICROSCOPY;

LASER IRRADIATION; OPTICAL POWER; PHOTOAMPERIC PROBES; PHOTOINDUCED TUNNEL CURRENTS; SEMICONDUCTOR TIPS;

PHOTOELECTRIC DEVICES;

EID: 0028767293     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.110891     Document Type: Article

References (13)