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Volumn 93, Issue C, 1994, Pages 263-273
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Use of atomic force microscope for the measurements of hydrophobic forces
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Author keywords
Atomic force microscope; Cavitation; Domains; Hydrophobic force; Silanated silica
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Indexed keywords
ADHESION;
ADSORPTION;
ARGON;
CAVITATION;
CONTACT ANGLE;
FORCE MEASUREMENT;
SILANES;
SILICA;
SURFACE ACTIVE AGENTS;
SURFACES;
WATER;
HYDROPHILICITY;
HYDROPHOBICITY;
MOLECULAR CLUSTERS;
YOUNG DUPRE EQUATION;
ATOMIC FORCE MICROSCOPY;
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EID: 0028766108
PISSN: 09277757
EISSN: None
Source Type: Journal
DOI: 10.1016/0927-7757(94)02985-7 Document Type: Article |
Times cited : (85)
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References (56)
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