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Volumn 93, Issue C, 1994, Pages 263-273

Use of atomic force microscope for the measurements of hydrophobic forces

Author keywords

Atomic force microscope; Cavitation; Domains; Hydrophobic force; Silanated silica

Indexed keywords

ADHESION; ADSORPTION; ARGON; CAVITATION; CONTACT ANGLE; FORCE MEASUREMENT; SILANES; SILICA; SURFACE ACTIVE AGENTS; SURFACES; WATER;

EID: 0028766108     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/0927-7757(94)02985-7     Document Type: Article
Times cited : (85)

References (56)
  • 46
    • 85020019818 scopus 로고    scopus 로고
    • S.J. Miklavic, D.Y.C. Chan, L.R. White and T.W. Healy, J. Phys. Chem., in press.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.