Study of zero-bias conductance peaks in YBCO films by LT-STM

Physica B: Physics of Condensed Matter

Volumn 194-196, Issue PART 2, 1994, Pages 2119-2120

  Kashiwaya, S ^a   Koyanagi, M ^a   Matsuda, M ^a   Kajimura, K ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL IMPURITIES; ELECTRIC RESISTANCE MEASUREMENT; ELECTRON REFLECTION; ELECTRON TUNNELING; HIGH TEMPERATURE SUPERCONDUCTORS; LOW TEMPERATURE TESTING; MAGNETIC FIELD EFFECTS; MICROSCOPIC EXAMINATION; THIN FILM DEVICES; YTTRIUM COMPOUNDS;

ANDREEV REFLECTION; CONDUCTANCE SPECTRA; LOCALIZED SPIN MOMENT; LOW TEMPERATURE SCANNING TUNNELING MICROSCOPY; MAGNETIC IMPURITIES; SCANNING TUNNELING SPECTROSCOPY; THIN FILM JUNCTIONS; TUNNELING SPECTRA; ZERO BIAS CONDUCTANCE PEAK;

SUPERCONDUCTING FILMS;

EID: 0028760190     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(94)91559-8     Document Type: Article

References (8)