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Volumn 17, Issue 4, 1994, Pages 631-643

A Practical Excimer Laser-Based Cleaning Tool For Removal Of Surface Contaminants

Author keywords

explosive vaporization; industrial laser application; Laser cleaning; laser induced particle removal; microcontamination; microdevice manufacturing

Indexed keywords

EXCIMER LASERS; IMPURITIES; IRRADIATION; LASER BEAM EFFECTS; MICROELECTRONICS; ULTRAVIOLET RADIATION; VAPORIZATION;

EID: 0028757082     PISSN: 10709886     EISSN: None     Source Type: Journal    
DOI: 10.1109/95.335050     Document Type: Article
Times cited : (93)

References (56)
  • 1
    • 0021386771 scopus 로고
    • Particle contamination and device performance
    • Mar.
    • M. Duffalo and J.R. Monkowski, “Particle contamination and device performance,” Solid State Technol., pp. 109–114, Mar. 1984.
    • (1984) Solid State Technol. , pp. 109-114
    • Duffalo, M.1    Monkowski, J.R.2
  • 2
    • 84941543812 scopus 로고
    • Fine particles on semiconductor surfaces: Sources, removal, and impact on the semiconductor industry
    • K.L. Mittal, Ed. New York: Plenum
    • S.A. Hoenig, “Fine particles on semiconductor surfaces: Sources, removal, and impact on the semiconductor industry,” in Particles on Surfaces I, K.L. Mittal, Ed. New York: Plenum, 1988.
    • (1988) Particles on Surfaces I
    • Hoenig, S.A.1
  • 3
    • 0025456679 scopus 로고
    • Contamination control: Problems and prospects
    • July
    • T. Hattori, “Contamination control: Problems and prospects,” Solid State TechnoL, pp. sl-s8, July 1990.
    • (1990) Solid State TechnoL , pp. sl-s8
    • Hattori, T.1
  • 4
    • 0024130647 scopus 로고
    • Methods for surface particle removal: A comparative study
    • K.L. Mittal, Ed. New York: Plenum
    • J. Bardina, “Methods for surface particle removal: A comparative study,” in Particles on Surfaces, K.L. Mittal, Ed. New York: Plenum, 1988.
    • (1988) Particles on Surfaces
    • Bardina, J.1
  • 5
    • 0024629283 scopus 로고
    • Effects of particulate size, composition, and medium on silicon wafer cleaning
    • Mar.
    • V.B. Menon, L.D. Michaels, R.P. Donovan, and D.S. Ensor, “Effects of particulate size, composition, and medium on silicon wafer cleaning,” Solid State Technol., pp. s7-s12, Mar. 1989.
    • (1989) Solid State Technol. , pp. s7-s12
    • Menon, V.B.1    Michaels, L.D.2    Donovan, R.P.3    Ensor, D.S.4
  • 6
    • 0014800514 scopus 로고
    • Cleaning solutions based on hydrogen peroxide for use in silicon semiconductor technology
    • W. Kern and D.A. Puotinen, “Cleaning solutions based on hydrogen peroxide for use in silicon semiconductor technology,” RCA Rev., vol. 31, pp. 187–206, 1970.
    • (1970) RCA Rev. , vol.31 , pp. 187-206
    • Kern, W.1    Puotinen, D.A.2
  • 8
    • 0022029193 scopus 로고
    • Megasonic particle removal from Solid State wafers
    • S. Shwartzman and A. Mayer, “Megasonic particle removal from Solid State wafers,” RCA Rev., vol. 46, pp. 81–105, 1985.
    • (1985) RCA Rev. , vol.46 , pp. 81-105
    • Shwartzman, S.1    Mayer, A.2
  • 9
    • 84930001670 scopus 로고
    • Dry surface cleaning using CO2 snow
    • R. Sherman, J. Grob, and W. Whitlock, “Dry surface cleaning using CO2 snow,” J Vac. Sci. TechnoL, vol. B9, pp. 1970–1977, 1991.
    • (1991) J Vac. Sci. TechnoL , vol.9 B , pp. 1970-1977
    • Sherman, R.1    Grob, J.2    Whitlock, W.3
  • 10
    • 0023843761 scopus 로고
    • Suspension mechanics for particle contamination control
    • S. Kim and C.J. Lawrence, “Suspension mechanics for particle contamination control,” Chem. Eng. Sci., vol. 43, pp. 991–1016, 1988.
    • (1988) Chem. Eng. Sci. , vol.43 , pp. 991-1016
    • Kim, S.1    Lawrence, C.J.2
  • 11
    • 0022122174 scopus 로고
    • An analysis of particle adhesion on semiconductor surfaces
    • R.A. Bowling, “An analysis of particle adhesion on semiconductor surfaces,” J. Electrochem. Soc, vol. 132, pp. 2208–2214, 1985.
    • (1985) J. Electrochem. Soc , vol.132 , pp. 2208-2214
    • Bowling, R.A.1
  • 12
    • 0021389922 scopus 로고
    • Improved contamination control in semiconductor manufacturing facilities
    • Mar.
    • S.A. Hoenig and S. Daniel, “Improved contamination control in semiconductor manufacturing facilities,” Solid State TechnoL, pp. 119–123, Mar. 1984.
    • (1984) Solid State TechnoL , pp. 119-123
    • Hoenig, S.A.1    Daniel, S.2
  • 13
    • 36448999056 scopus 로고
    • Laser-cleaning techniques for removal of surface particulates
    • A.C. Tarn, W.P. Leung, W. Zapka, and W. Ziemlich, “Laser-cleaning techniques for removal of surface particulates,” J. Appl. Phys., vol. 71, pp. 3515–3523, 1992.
    • (1992) J. Appl. Phys. , vol.71 , pp. 3515-3523
    • Tarn, A.C.1    Leung, W.P.2    Zapka, W.3    Ziemlich, W.4
  • 14
    • 0001248896 scopus 로고
    • Efficient pulsed laser removal of 0.2 μm sized particles from a solid surface
    • W. Zapka, W. Ziemlich, and A.C. Tarn, “Efficient pulsed laser removal of 0.2 μm sized particles from a solid surface,” Appl. Phys. Lett., vol. 58, pp. 2217–2219, 1991.
    • (1991) Appl. Phys. Lett. , vol.58 , pp. 2217-2219
    • Zapka, W.1    Ziemlich, W.2    Tarn, A.C.3
  • 16
    • 36449005632 scopus 로고
    • Laser-assisted micron scale particle removal
    • K. Imen, S.J. Lee, and S.D. Allen, “Laser-assisted micron scale particle removal,” Appl. Phys. Lett., vol. 58, pp. 20.3–205, 1991.
    • (1991) Appl. Phys. Lett. , vol.58 , pp. 203-205
    • Imen, K.1    Lee, S.J.2    Allen, S.D.3
  • 17
    • 0000647352 scopus 로고
    • CO2 laser assisted particle removal threshold measurements
    • S.J. Lee, K. Imen, and S.D. allen, “CO2 laser assisted particle removal threshold measurements,” Appl. Phys. Lett., vol. 61, pp. 2314–2316, 1992.
    • (1992) Appl. Phys. Lett. , vol.61 , pp. 2314-2316
    • Lee, S.J.1    Imen, K.2    allen, S.D.3
  • 18
    • 1942530466 scopus 로고
    • Scanning UV laser removal of contaminants from semiconductor and optical surfaces
    • K.L. Mittal, Ed. New York: Plenum
    • T.J. Magee and C.S. Leung, “Scanning UV laser removal of contaminants from semiconductor and optical surfaces,” in Particles on Surfaces 3, K.L. Mittal, Ed. New York: Plenum, 1991.
    • (1991) Particles on Surfaces 3
    • Magee, T.J.1    Leung, C.S.2
  • 19
    • 0025328933 scopus 로고
    • Dust busters
    • June
    • P.E. Ross, “Dust busters,” Sci. Amer., pp. 86–87, June 1990.
    • (1990) Sci. Amer. , pp. 86-87
    • Ross, P.E.1
  • 21
    • 84941543814 scopus 로고
    • Is laser removal of graffiti practical?
    • K.X. Liu, E. Garmire, and L. Fathe, “Is laser removal of graffiti practical?” Amer. Phys. Soc. Bull., vol. 38, pp. 1731–1732, 1993.
    • (1993) Amer. Phys. Soc. Bull. , vol.38 , pp. 1731-1732
    • Liu, K.X.1    Garmire, E.2    Fathe, L.3
  • 22
    • 0019562018 scopus 로고
    • The optical properties of Kapton: measurement and applications
    • E.T. Arakawa, M.W. Williams, J.C. Ashley, and L.R. Painter, “The optical properties of Kapton: measurement and applications,” J. Appl. Phys., vol. 52, pp. 3579–3582, 1981.
    • (1981) J. Appl. Phys. , vol.52 , pp. 3579-3582
    • Arakawa, E.T.1    Williams, M.W.2    Ashley, J.C.3    Painter, L.R.4
  • 24
    • 0022801644 scopus 로고
    • Ablation of polymers and biological tissue by ultraviolet lasers
    • R. Srinivasan, “Ablation of polymers and biological tissue by ultraviolet lasers,” Science, vol. 234, pp. 559–565, 1986.
    • (1986) Science , vol.234 , pp. 559-565
    • Srinivasan, R.1
  • 25
    • 2542432272 scopus 로고
    • Laser-induced thermal desorption of moisture from a surface in atmospheric conditions
    • A.C. Tarn and H. Schroeder,” Laser-induced thermal desorption of moisture from a surface in atmospheric conditions,” J. Appl. Phys., vol. 64, pp. 3667–3671, 1988.
    • (1988) J. Appl. Phys. , vol.64 , pp. 3667-3671
    • Tarn, A.C.1    Schroeder, H.2
  • 26
    • 0021532047 scopus 로고
    • Contaminant and defect analysis of optical surfaces by infrared laser induced desorption
    • S.D. Allen, J.O. Porteus, W.N. Faith, and J.B. Franck, “Contaminant and defect analysis of optical surfaces by infrared laser induced desorption,” Appl. Phys. Lett., vol. 45, pp. 997–999, 1984.
    • (1984) Appl. Phys. Lett. , vol.45 , pp. 997-999
    • Allen, S.D.1    Porteus, J.O.2    Faith, W.N.3    Franck, J.B.4
  • 28
    • 0022027577 scopus 로고
    • Laser sputtering: Part HI. The mechanism of the sputtering of metals low energy densities
    • R. Kelly and J.E. Rothenberg, “Laser sputtering: Part HI. The mechanism of the sputtering of metals low energy densities,” Nucl. Instrum. Methods, vol. B7/8, pp. 755–763, 1985.
    • (1985) Nucl. Instrum. Methods , vol.B7/8 , pp. 755-763
    • Kelly, R.1    Rothenberg, J.E.2
  • 29
    • 0039747175 scopus 로고
    • Preparation of atomically clean silicon surfaces by pulsed laser irradiation
    • D.M. Zehner, C.W. White, and G.W. Ownby, “Preparation of atomically clean silicon surfaces by pulsed laser irradiation,” Appl. Phys. Lett., vol. 36, pp. 56–59, 1980.
    • (1980) Appl. Phys. Lett. , vol.36 , pp. 56-59
    • Zehner, D.M.1    White, C.W.2    Ownby, G.W.3
  • 30
    • 0017000530 scopus 로고
    • Effect of water and paint coatings on the magnitude of laser-generated shocks
    • B.P. Fairand and A.H. Clauer, “Effect of water and paint coatings on the magnitude of laser-generated shocks,” Opt. Commun., vol. 18, pp. 588–591, 1976.
    • (1976) Opt. Commun. , vol.18 , pp. 588-591
    • Fairand, B.P.1    Clauer, A.H.2
  • 31
    • 0002654148 scopus 로고
    • Noncontact monitoring of laser ablation using a miniature piezoelectric probe to detect photoacoustic pulse in air
    • W.P. Leung and A.C. Tarn, “Noncontact monitoring of laser ablation using a miniature piezoelectric probe to detect photoacoustic pulse in air,” Appl. Phys. Lett., vol. 60. pp. 23–25, 1992.
    • (1992) Appl. Phys. Lett. , vol.60 , pp. 23-25
    • Leung, W.P.1    Tarn, A.C.2
  • 32
    • 0001768074 scopus 로고
    • Photodeflection probing of the explosion of a liquid film in contact with a solid heated by pulsed excimer laser irradiation
    • N. Do, L. Klees, A.C. Tarn, P.T. Leung, and W.P. Leung, “Photodeflection probing of the explosion of a liquid film in contact with a solid heated by pulsed excimer laser irradiation,” J. Appl. Phys., vol. 74, pp. 1534–1538, 1993.
    • (1993) J. Appl. Phys. , vol.74 , pp. 1534-1538
    • Do, N.1    Klees, L.2    Tarn, A.C.3    Leung, P.T.4    Leung, W.P.5
  • 33
    • 0027904250 scopus 로고
    • Shock wave analysis of laser assisted particle removal
    • S.J. Lee, K. Imen, and S.D. Allen, “Shock wave analysis of laser assisted particle removal,” J. Appl. Phys., vol. 74, pp. 7044–7047, 1993.
    • (1993) J. Appl. Phys. , vol.74 , pp. 7044-7047
    • Lee, S.J.1    Imen, K.2    Allen, S.D.3
  • 34
    • 0001165799 scopus 로고
    • Transmission studies of explosive vaporization of a transparent liquid film on an opaque solid surface induced by excimer-laser-pulsed irradiation
    • P.T. Leung et al., “Transmission studies of explosive vaporization of a transparent liquid film on an opaque solid surface induced by excimer-laser-pulsed irradiation,” J. Appl. Phys., vol. 72, pp. 2256–2263, 1992.
    • (1992) J. Appl. Phys. , vol.72 , pp. 2256-2263
    • Leung, P.T.1
  • 35
    • 0000203616 scopus 로고
    • Optical reflectance and scattering studies of nucleation and growth of bubbles at a liquid-solid interface induced by pulsed laser heating
    • O. Yavas et al., “Optical reflectance and scattering studies of nucleation and growth of bubbles at a liquid-solid interface induced by pulsed laser heating,” Phys. Rev. Lett., vol. 70, pp. 1830–1833, 1993.
    • (1993) Phys. Rev. Lett. , vol.70 , pp. 1830-1833
    • Yavas, O.1
  • 36
    • 0028406254 scopus 로고
    • Optical and acoustic study of nucleation and growth of bubbles at a liquid-solid interface induced by nanosecond-pulsed laser heating
    • O. Yavas et al., “Optical and acoustic study of nucleation and growth of bubbles at a liquid-solid interface induced by nanosecond-pulsed laser heating,” Appl. Phys. A, vol. 58, pp. 407–415, 1994.
    • (1994) Appl. Phys. A , vol.58 , pp. 407-415
    • Yavas, O.1
  • 37
    • 0024739762 scopus 로고
    • Excimer lasers in a fabrication line for a highly integrated printed circuit board
    • F. Backmann, “Excimer lasers in a fabrication line for a highly integrated printed circuit board,” Chemtronics, vol. 4, pp. 149–152, 1989.
    • (1989) Chemtronics , vol.4 , pp. 149-152
    • Backmann, F.1
  • 38
    • 34249839342 scopus 로고
    • Excimer laser ablation of polyimide in a manufacturing facility
    • J.R. Lankard Sr. and G. Wolbold, “Excimer laser ablation of polyimide in a manufacturing facility,” Appl. Phys. A, vol. A54, pp. 355–359, 1992.
    • (1992) Appl. Phys. A , vol.54 A , pp. 355-359
    • Lankard, J.R.1    Wolbold, G.2
  • 39
    • 3643139270 scopus 로고
    • Excimer laser–a reliable tool for microprocessing and surface treatment
    • R. Pätzel and H. Elndert, “Excimer laser–a reliable tool for microprocessing and surface treatment,” Proc. AIP, vol. 288, pp. 613–618, 1993.
    • (1993) Proc. AIP , vol.288 , pp. 613-618
    • Pätzel, R.1    Elndert, H.2
  • 41
    • 0025535001 scopus 로고
    • Industrial laser applications
    • F.G. Bachmann, “Industrial laser applications,” Appl. Surf. Sci., vol. 46, pp. 254–263, 1990.
    • (1990) Appl. Surf. Sci. , vol.46 , pp. 254-263
    • Bachmann, F.G.1
  • 42
    • 0025841417 scopus 로고
    • What industry needs in a high power excimer laser
    • J.R. Lankard, Sr., “What industry needs in a high power excimer laser,” Proc. SPIE, vol. 1377, pp. 2–5, 1990.
    • (1990) Proc. SPIE , vol.1377 , pp. 2-5
    • Lankard, J.R.1
  • 43
    • 0003358775 scopus 로고
    • Testing of the durability of single-crystal calcium fluoride with and without antireflection coatings for use with high-power KrF excimer lasers
    • D.J. Krajnovich et al., “Testing of the durability of single-crystal calcium fluoride with and without antireflection coatings for use with high-power KrF excimer lasers,” Appl. Opt., vol. 31, pp. 6062–6075, 1992.
    • (1992) Appl. Opt. , vol.31 , pp. 6062-6075
    • Krajnovich, D.J.1
  • 44
    • 0001368101 scopus 로고
    • Effect of intense and prolonged 248 nm pulsed-laser irradiation on the properties of ultraviolet-grade fused silica
    • W.P. Leung, M. Kulkarni, D. Krajnovich, and A.C. Tarn, “Effect of intense and prolonged 248 nm pulsed-laser irradiation on the properties of ultraviolet-grade fused silica,” Appl. Phys. Lett., vol. 58, pp. 551–553, 1991.
    • (1991) Appl. Phys. Lett. , vol.58 , pp. 551-553
    • Leung, W.P.1    Kulkarni, M.2    Krajnovich, D.3    Tarn, A.C.4
  • 45
    • 0027843857 scopus 로고
    • 248 nm lens materials: Performance and durability issues in an industrial environment
    • D.J. Krajnovich, I.K. Pour, A.C. Tarn, W.P. Leung, and M.V. Kulkarni, “248 nm lens materials: Performance and durability issues in an industrial environment,” Proc. SPIE, vol. 1848, pp. 544–560, 1992.
    • (1992) Proc. SPIE , vol.1848 , pp. 544-560
    • Krajnovich, D.J.1    Pour, I.K.2    Tarn, A.C.3    Leung, W.P.4    Kulkarni, M.V.5
  • 46
    • 0025894218 scopus 로고
    • Gas handling technology for excimer lasers
    • R.E. Turner, J.L. Remo, E. Bradford, and A. Dietz, “Gas handling technology for excimer lasers,” Proc. SPIE, vol. 1377, pp. 99–106, 1990.
    • (1990) Proc. SPIE , vol.1377 , pp. 99-106
    • Turner, R.E.1    Remo, J.L.2    Bradford, E.3    Dietz, A.4
  • 47
    • 84941543815 scopus 로고
    • Laser cleaning of a delicate (easily laser-damaged) surface
    • A.C. Tam and W. Zapka, “Laser cleaning of a delicate (easily laser-damaged) surface,” IBM Tech. Disci. Bull., vol. 35, pp. 70–71, 1992.
    • (1992) IBM Tech. Disci. Bull. , vol.35 , pp. 70-71
    • Tam, A.C.1    Zapka, W.2
  • 48
    • 0020831543 scopus 로고
    • A theoretical model for multiple-pulse laser-induced damage to metal mirrors
    • C.S. Lee, N. Koumvakalis, and M. Bass, “A theoretical model for multiple-pulse laser-induced damage to metal mirrors,” J. Appl. Phys., vol. 54, pp. 5727–5731, 1983.
    • (1983) J. Appl. Phys. , vol.54 , pp. 5727-5731
    • Lee, C.S.1    Koumvakalis, N.2    Bass, M.3
  • 49
    • 0016916976 scopus 로고
    • Laser-induced damage to semiconductors
    • Y. Matsuoka, “Laser-induced damage to semiconductors,” J. Phys. D, vol. 9, pp. 215–224, 1976.
    • (1976) J. Phys. D , vol.9 , pp. 215-224
    • Matsuoka, Y.1
  • 50
    • 11744280133 scopus 로고
    • Transient optical transmission measurement in excimer-laser irradiation of amorphous silicon films
    • H.K. Park et al., “Transient optical transmission measurement in excimer-laser irradiation of amorphous silicon films,” ASME Trans. J. Heat Transfer, vol. 115, pp. 178–183, 1993.
    • (1993) ASME Trans. J. Heat Transfer , vol.115 , pp. 178-183
    • Park, H.K.1
  • 51
    • 85004397045 scopus 로고
    • New York: IFI/Plenum, Y.S. Touloukian and E.H. Buyco, Thermophysical Properties of Matter–Specific Heat, vol. 4. New York: IFI/Plenum, 1970.
    • Y.S. Touloukian, R.W. Powell, C.Y. Ho, and P.G. Klemens, Thermophysical Properties of Matter–Thermal Conductivity, vol. 1. New York: IFI/Plenum, 1970; Y.S. Touloukian and E.H. Buyco, Thermophysical Properties of Matter–Specific Heat, vol. 4. New York: IFI/Plenum, 1970.
    • (1970) Thermophysical Properties of Matter–Thermal Conductivity , vol.1
    • Touloukian, Y.S.1    Powell, R.W.2    Ho, C.Y.3    Klemens, P.G.4
  • 52
    • 0000847860 scopus 로고
    • Thermoelastic stress production in solid
    • J.C. Bushneil and D.J. McCloskey, “Thermoelastic stress production in solid,” J. Appl. Phys., vol. 39, pp. 5541–5546, 1968.
    • (1968) J. Appl. Phys. , vol.39 , pp. 5541-5546
    • Bushneil, J.C.1    McCloskey, D.J.2
  • 55
    • 0020138614 scopus 로고
    • Reduction of shear strength and phase-transition in shock-loaded silicon
    • T. Goto, T. Sato, and Y. Syono, “Reduction of shear strength and phase-transition in shock-loaded silicon,” Japan J. Appl. Phys., vol. 21, pp. L369-L371, 1982.
    • (1982) Japan J. Appl. Phys. , vol.21 , pp. L369-L371
    • Goto, T.1    Sato, T.2    Syono, Y.3
  • 56
    • 84941543817 scopus 로고    scopus 로고
    • The use of trade names or manufacturers in this paper does not constitute an endorsement of their products or equipment.
    • The use of trade names or manufacturers in this paper does not constitute an endorsement of their products or equipment.


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