Design methodology for low-voltage MOSFETs

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1994, Pages 79-82

  Andoh, Takeshi ^a   Furukawa, Akio ^a   Kunio, Takemitsu ^a  

^a NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; LEAKAGE CURRENTS; LSI CIRCUITS; STANDBY POWER SYSTEMS; SUBSTRATES; VOLTAGE CONTROL;

FORWARD SUBSTRATE VOLTAGE; SHORT CHANNEL EFFECT; THRESHOLD VOLTAGE;

MOSFET DEVICES;

EID: 0028756728     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)