Design-for-test technique for switched-capacitor filters

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1994, Pages 42-47

  Soma, Mani ^a   Kolarik, Vladimir ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; CONTROLLABILITY; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK SYNTHESIS; FORMAL LOGIC; LOGIC GATES; OBSERVABILITY;

DESIGN FOR TEST TECHNIQUE; INTERNAL NODES; SWITCHED CAPACITOR FILTERS;

SWITCHED FILTERS;

EID: 0028756093     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)