Coverage metrics for functional tests

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1994, Pages 176-181

  Wallack, John R ^a   Dandapani, Ramaswami ^a  

^a LOCKHEED MARTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER SIMULATION; COMPUTER SOFTWARE; PARALLEL PROCESSING SYSTEMS; SPECIFICATIONS;

COMPLETENESS; CONTROL FLOW COVERAGE; CONTROL FLOW GRAPH; DATA FLOW TESTING; DATA PATH COVERAGE; DESIGN VERIFICATION SYSTEMS; ERROR SEEDING; FUNCTIONAL TEST;

COMPUTER SOFTWARE SELECTION AND EVALUATION;

EID: 0028751143     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)