X-ray scattering signatures for material identification

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2092, Issue , 1994, Pages 366-377

  Speller, Robert D ^a   Horrocks, Julie A ^a   Lacey, Richard J ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; ELECTROMAGNETIC WAVE SCATTERING; EXPLOSIVES;

DIFFRACTION EFFECTS; EXPLOSIVES IDENTIFICATION; X RAY SCATTERING SIGNATURES;

X RAY ANALYSIS;

EID: 0028750932     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (3)