Effects of losses in power and ground planes in the simulation of simultaneous switching noise

IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Volumn , Issue , 1994, Pages 109-111

  Fang, Jiayuan ^a   Xue, Danwei ^a   Chen, Yuzhe ^a  

^a BINGHAMTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC LOSSES; RECURSIVE FUNCTIONS; SEMICONDUCTOR DEVICE MODELS; SKIN EFFECT; SPURIOUS SIGNAL NOISE; SWITCHING CIRCUITS;

FREQUENCY DEPENDENT SKIN EFFECT LOSS; GROUND PLANES; SIMULTANEOUS SWITCHING NOISE;

ELECTRONICS PACKAGING;

EID: 0028750076     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)