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Volumn 2, Issue , 1994, Pages 693-699
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Microscopic optical beam induced current measurements and their applications
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARACTERIZATION;
CRYSTAL DEFECTS;
ELECTRIC CURRENT MEASUREMENT;
ELECTRIC FIELD EFFECTS;
ELECTRONS;
LASER BEAMS;
LEAKAGE CURRENTS;
MICROSCOPES;
OPTICAL RESOLVING POWER;
PHOTOEMISSION;
SEMICONDUCTOR JUNCTIONS;
CONDUCTION ELECTRON;
CONFORCAL LASER MICROSCOPE;
HOLE;
LATCHUP PHENOMENA;
OPTICAL BEAM INDUCED CURRENT SYSTEM;
PHOTOCURRENTS;
PN JUNCTIONS;
OPTICAL SYSTEMS;
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EID: 0028750068
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
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Times cited : (18)
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References (8)
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