Use of parasitic elements to remove potential E-plane scan blindness in high dielectric substrate microstrip patch probe-fed phased arrays

IEEE Antennas and Propagation Society, AP-S International Symposium (Digest)

Volumn 1, Issue , 1994, Pages 456-459

  Waterhouse, R B ^a  

^a RMIT UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ANTENNA FEEDERS; CIRCUIT THEORY; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; DIRECTIONAL PATTERNS (ANTENNA); MICROSTRIP ANTENNAS; SUBSTRATES;

HIGH DIELECTRIC SUBSTRATE MICROSTRIP PATCH PROBE FED PHASED ARRAYS; MICROSTRIP PATCHES; PARASITIC ELEMENTS; POTENTIAL E PLANE SCAN BLINDNESS;

ANTENNA PHASED ARRAYS;

EID: 0028744518     PISSN: 02724693     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)