Dynamic performance and leakage current characteristics of 1/4-micron-gate ultra-thin CMOS/SIMOX gate array

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1994, Pages 665-668

  Kado, Y ^a   Ohno, T ^a   Sakakibara, Y ^a   Kawai, Y ^a   Yamamoto, E ^a   Ohtaka, A ^a   Tsuchiya, T ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CELLULAR ARRAYS; CMOS INTEGRATED CIRCUITS; ELECTRIC VARIABLES MEASUREMENT; GAIN CONTROL; LEAKAGE CURRENTS; LSI CIRCUITS; SWITCHING FUNCTIONS; THIN FILM DEVICES;

CMOS/SIMOX GATE ARRAYS; OFF STATE PERIOD;

LOGIC GATES;

EID: 0028743978     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)