New high level testability measure: description and evaluation

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1994, Pages 421-426

  Gentil, M H ^a   Crestani, D ^a   El Rhalibi, A ^a   Durante, C ^a  

^a LIRMM   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; CONSTRAINT THEORY; LOGIC DESIGN; VECTORS;

EXTRINSIC CONSTRAINTS; FAULTY VALUE MODELLING; INTRINSIC CONSTRAINTS;

INTEGRATED CIRCUIT TESTING;

EID: 0028743347     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)