Influence of tester, test method and device type on CDM ESD testing

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1994, Pages 49-62

  Verhaege, Koen ^a   Groeseneken, Guido ^a   Maes, Herman E ^a   Egger, Peter ^a   Gieser, Horst ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; DATABASE SYSTEMS; ELECTRIC DISCHARGES; ELECTRIC FAULT CURRENTS; ELECTRONICS PACKAGING; INTEGRATED CIRCUITS; SUBSTRATES; WAVEFORM ANALYSIS;

CHARGED DEVICE MODEL; ELECTROSTATIC DISCHARGE; HUMAN BODY MODEL; MACHINE MODEL; SOCKET PARASITICS;

ELECTRONIC EQUIPMENT TESTING;

EID: 0028743236     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (37)