메뉴 건너뛰기




Volumn 41, Issue 12, 1994, Pages 2262-2267

Improved Model for Kink Effect in AlGaAs/InGaAs Heterojunction FET’s

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRON TRANSPORT PROPERTIES; HETEROJUNCTIONS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DOPING;

EID: 0028742726     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.337437     Document Type: Article
Times cited : (21)

References (21)
  • 2
    • 0026402785 scopus 로고
    • The substrate current by impact ionization in GaAs MESFETs
    • T. Yokoyama and A. Tamura, “The substrate current by impact ionization in GaAs MESFETs,” Inst. Phys. Conf. Ser., no. 120, pp. 239–242, 1992.
    • (1992) Inst. Phys. Conf. Ser. , Issue.120 , pp. 239-242
    • Yokoyama, T.1    Tamura, A.2
  • 3
    • 0024071385 scopus 로고
    • Sidegating effect in inverted AIGaAs/GaAs HEMT
    • H. I. Fujishiro, T. Saito, S. Nishi, and Y. Sano, “Sidegating effect in inverted AIGaAs/GaAs HEMT,” Japan. J. Appl. Phys., vol. 27, pp. 1742–1745, 1988.
    • (1988) Japan. J. Appl. Phys. , vol.27 , pp. 1742-1745
    • Fujishiro, H.I.1    Saito, T.2    Nishi, S.3    Sano, Y.4
  • 5
    • 0026938379 scopus 로고
    • Kink effect in HEMT structures: a trap-related semi-quantitative model and an empirical approach for SPICE simulation
    • T. Zimmer, D. Ouro Bodi, J. M. Dumas, N. Labat, A. Touboul, and Y. Danto, “Kink effect in HEMT structures: a trap-related semi-quantitative model and an empirical approach for SPICE simulation,” Solid-State Electron., vol. 35, no. 10, pp. 1543–1548, 1992.
    • (1992) Solid-State Electron. , vol.35 , Issue.10 , pp. 1543-1548
    • Zimmer, T.1    Ouro Bodi, D.2    Dumas, J.M.3    Labat, N.4    Touboul, A.5    Danto, Y.6
  • 8
    • 0343875042 scopus 로고
    • Dc and rf measurements of the kink effect in 0.2 pm gate length AlInAs/GalnAs/InP modulation-doped field-effect transistors
    • L. F. Palmateer, P. J. Tasker, W. J. Schaff, L. D. Nguyen, and L. F. Eastman, “Dc and rf measurements of the kink effect in 0.2 pm gate length AlInAs/GalnAs/InP modulation-doped field-effect transistors,” Appl. Phys. Lett., vol. 54, pp. 2139–2141, 1989.
    • (1989) Appl. Phys. Lett. , vol.54 , pp. 2139-2141
    • Palmateer, L.F.1    Tasker, P.J.2    Schaff, W.J.3    Nguyen, L.D.4    Eastman, L.F.5
  • 9
    • 0027560908 scopus 로고
    • Numerical analysis of kink effect in HJFET with a heterobuffer layer
    • K. Kunihiro, H. Yano, N. Goto, and Y. Ohno, “Numerical analysis of kink effect in HJFET with a heterobuffer layer,” IEEE Trans. Electron Devices, vol. 40, pp. 493–497, 1993.
    • (1993) IEEE Trans. Electron Devices , vol.40 , pp. 493-497
    • Kunihiro, K.1    Yano, H.2    Goto, N.3    Ohno, Y.4
  • 11
    • 0024959530 scopus 로고
    • Observation and mechanism of kink effect in depletion-mode AIGaAs/GaAs and AlGaAs/GalnAs HEMTs
    • A. Thomasian, A. A. Rezazadeh, and L. G. Hipwood, “Observation and mechanism of kink effect in depletion-mode AIGaAs/GaAs and AlGaAs/GalnAs HEMTs,” Electronics Lett., vol. 25, pp. 351–352, 1989.
    • (1989) Electronics Lett. , vol.25 , pp. 351-352
    • Thomasian, A.1    Rezazadeh, A.A.2    Hipwood, L.G.3
  • 12
    • 0027307622 scopus 로고
    • 3 V operation L-band power double-doped heterojunction FETs
    • N. Iwata, K. Inosako, and M. Kuzuhara, “3 V operation L-band power double-doped heterojunction FETs,” IEEE MTT-S Int. Microwave Symp. Dig., vol. 3, pp. 1465–1468, 1993.
    • (1993) IEEE MTT-S Int. Microwave Symp. Dig. , vol.3 , pp. 1465-1468
    • Iwata, N.1    Inosako, K.2    Kuzuhara, M.3
  • 13
    • 0007081169 scopus 로고
    • A novel electron-beam exposure technique for 0.1µm T-shaped gate fabrication
    • N. Samoto, Y. Makino, K. Onda, E. Mizuki, and T. Itoh, “A novel electron-beam exposure technique for 0.1µm T-shaped gate fabrication,” J. Vac. Sci. Technol., vol. B8, pp. 1335–1338, 1990.
    • (1990) J. Vac. Sci. Technol. , vol.8 B , pp. 1335-1338
    • Samoto, N.1    Makino, Y.2    Onda, K.3    Mizuki, E.4    Itoh, T.5
  • 14
    • 0342831634 scopus 로고
    • Impact ionization, recombination, and visible light emission in AlGaAs/GaAs high electron mobility transistors
    • E. Zanoni, A. Pacagnella, P. Pisoni, P. Telaroli, C. Tedesco, and C. Canali, “Impact ionization, recombination, and visible light emission in AlGaAs/GaAs high electron mobility transistors,” J. Appl. Phys., vol. 70, 529–531, 1991.
    • (1991) J. Appl. Phys. , vol.70
    • Zanoni, E.1    Pacagnella, A.2    Pisoni, P.3    Telaroli, P.4    Tedesco, C.5    Canali, C.6
  • 15
    • 0042504124 scopus 로고
    • Electrical measurement on n+-GaAs-undoped Ga0.6Al0.4As capacitors
    • P. M. Solomon, T. W. Hickmott, H. Morkoc, and R. Fisher, “Electrical measurement on n+-GaAs-undoped Ga0.6Al0.4As capacitors,” Appl. Phys. Lett., vol. 42, pp. 821–823, 1983.
    • (1983) Appl. Phys. Lett. , vol.42 , pp. 821-823
    • Solomon, P.M.1    Hickmott, T.W.2    Morkoc, H.3    Fisher, R.4
  • 16
    • 0021121106 scopus 로고
    • Resonant Fowler-Nordheim tunneling in n-GaAs-undoped AlxGa1-xAs —n+GaAs capacitors
    • T. W. Hickmott, P. M. Solomon, R. Fisher, and H. Morkoç, “Resonant Fowler-Nordheim tunneling in n-GaAs-undoped AlxGa1-xAs —n+GaAs capacitors,” Appl. Phys. Lett., vol. 44, pp. 90–92, 1984.
    • (1984) Appl. Phys. Lett. , vol.44 , pp. 90-92
    • Hickmott, T.W.1    Solomon, P.M.2    Fisher, R.3    Morkoç, H.4
  • 17
    • 36549099077 scopus 로고
    • Negative charge, barrier heights, and the conduction band discontinuity in AlxGa1-x As capacitors
    • T. W. Hickmott, P. M. Solomon, R. Fisher, and H. Morkoç, “Negative charge, barrier heights, and the conduction band discontinuity in AlxGa1-x As capacitors.” J. Appl. Phys., vol. 57, pp. 2844–2853, 1985.
    • (1985) J. Appl. Phys. , vol.57 , pp. 2844-2853
    • Hickmott, T.W.1    Solomon, P.M.2    Fisher, R.3    Morkoç, H.4
  • 18
    • 0022683040 scopus 로고
    • Deep level analysis in heterostructure field-effect transistor by means of the photo-FET method
    • M. Heuken, L. Loreck, K. Heime, K. Ploog, W. Schlapp, and G. Weiman, “Deep level analysis in heterostructure field-effect transistor by means of the photo-FET method,” IEEE Trans. Electron Devices, vol. ED-33, pp. 693–697, 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 693-697
    • Heuken, M.1    Loreck, L.2    Heime, K.3    Ploog, K.4    Schlapp, W.5    Weiman, G.6
  • 19
    • 0022683296 scopus 로고
    • On the low-temperature degradation of (AlGa)As/GaAs modulation-doped field effect transistors
    • A. Kastalsky and R. A. Kiehl, “On the low-temperature degradation of (AlGa)As/GaAs modulation-doped field effect transistors,” IEEE Trans. Electron Devices, vol. ED-33, pp. 414–423, 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 414-423
    • Kastalsky, A.1    Kiehl, R.A.2
  • 20
    • 36449005581 scopus 로고
    • Threshold of impact ionization in semiconductors
    • J. Bude and K. Hess, “Threshold of impact ionization in semiconductors,” J. Appl. Phys., vol. 72, pp. 3554–3561, 1992.
    • (1992) J. Appl. Phys. , vol.72 , pp. 3554-3561
    • Bude, J.1    Hess, K.2
  • 21
    • 0026927886 scopus 로고
    • Mesa-sidewall gate leakage in InAlAs/INGaAs heterostructure field-effect transistors
    • S. R. Bahl, M. H. Leary, and J. A. del Alamo, “Mesa-sidewall gate leakage in InAlAs/INGaAs heterostructure field-effect transistors,” IEEE Trans. Electron Devices, vol. 39, pp. 2037–2043, 1992.
    • (1992) IEEE Trans. Electron Devices , vol.39 , pp. 2037-2043
    • Bahl, S.R.1    Leary, M.H.2    del Alamo, J.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.