|
|
|
Volumn , Issue , 1994, Pages 286-291
|
|
Automatic placement related core ESD failures in sub-micron gate arrays
|
|
Author keywords
[No Author keywords available]
|
|
Indexed keywords
ARRAYS;
CMOS INTEGRATED CIRCUITS;
DATA REDUCTION;
ELECTRIC DISCHARGES;
ELECTRIC NETWORK TOPOLOGY;
ELECTROSTATICS;
FAILURE ANALYSIS;
GATES (TRANSISTOR);
MICROSCOPES;
SENSITIVITY ANALYSIS;
STRESSES;
APPLICATION SPECIFIC INTEGRATED CIRCUITS;
CIRCUIT MODEL;
PHOTOEMISSION MICROSCOPE;
SUBMICRON GATE ARRAYS;
ELECTRIC EQUIPMENT PROTECTION;
|
|
EID: 0028742530
PISSN: 07395159
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
|
Times cited : (3)
|
|
References (4)
|
