Test embedding with discrete logarithms

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1994, Pages 74-80

  Lempel, Mody ^a   Gupta, Sandeep K ^a   Breuer, Melvin A ^a  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; FEEDBACK; POLYNOMIALS; SHIFT REGISTERS; STATE ASSIGNMENT; VLSI CIRCUITS;

BUILT IN SELF TEST; DISCRETE LOGARITHMS THEORY;

INTEGRATED CIRCUIT TESTING;

EID: 0028742088     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)