SCOPUS 정보 검색 플랫폼

Solid State Communications

Volumn 92, Issue 12, 1994, Pages 991-995

Fluorescence yield detection: Why it does not measure the X-ray absorption cross section

(5) de Groot, F M F a Arrio, M A b Sainctavit, Ph b Cartier, Ch a Chen, C T c

a UNIVERSITÉ PARIS SACLAY (France)

b UNIVERSITÉ PIERRE ET MARIE CURIE (France)

c LUCENT TECHNOLOGIES (United States)

Author keywords

E: X ray spectroscopies; synchrotron radiation

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CRYSTAL IMPURITIES; ELECTRON ENERGY LEVELS; FLUORESCENCE; LIGHT ABSORPTION; SYNCHROTRON RADIATION; TRANSITION METALS;

AUGER DECAY; FLUORESCENCE DECAY; FLUORESCENCE YIELD DETECTION; NICKEL EDGES; SELF ABSORPTION EFFECTS; XRAY ABSORPTION CROSS SECTION; XRAY EMISSION; XRAY MAGNETIC CIRCULAR DICHROISM;

X RAY SPECTROSCOPY;

EID: 0028741976 PISSN: 00381098 EISSN: None Source Type: Journal
DOI: 10.1016/0038-1098(94)90027-2 Document Type: Article

Times cited : (119)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.