On broad-side delay test

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1994, Pages 284-290

  Savir, Jacob ^a   Patil, Srinivas ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL CIRCUITS; ELECTRIC FAULT CURRENTS; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK SYNTHESIS; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS; STANDARDS; STATE ASSIGNMENT;

BROADSIDE DELAY TESTS;

LOGIC CIRCUITS;

EID: 0028741354     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)