Super-resolution and point spread function sensitivity analysis of the expectation-maximization algorithm for computational optical sectioning microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2302, Issue , 1994, Pages 369-378

  Conchello, Jose Angel ^a  

^a WASHINGTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; IMAGE ANALYSIS; OPTICAL RESOLVING POWER; SENSITIVITY ANALYSIS;

IMAGE ESTIMATION; OPTICAL MICROSCOPY; SUPERRESOLUTION;

MICROSCOPES;

EID: 0028740321     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (30)