SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 21, Issue 12, 1994, Pages 830-838

Dependence of SERS signal on surface roughness

(1) Kruszewski, Stefan a

a UNIVERSITY OF TECHNOLOGY AND LIFE SCIENCES (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODES; ELECTROMAGNETISM; LIGHT SCATTERING; MATHEMATICAL MODELS; RAMAN SCATTERING; REDOX REACTIONS; ROUGHNESS MEASUREMENT; SCANNING ELECTRON MICROSCOPY; SILVER; TRANSMISSION ELECTRON MICROSCOPY;

ROUGHNESS SIZE; SURFACE ENHANCED RAMAN SCATTERING (SERS) SIGNAL;

SURFACE ROUGHNESS;

EID: 0028739376 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.740211203 Document Type: Article

Times cited : (34)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.