Grating interferometry for analysis of residual stresses relieved by annealing

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2342, Issue , 1994, Pages 248-254

  Kujawinska, Malgorzata ^a   Salbut, Leszek A ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DIFFRACTION GRATINGS; RESIDUAL STRESSES;

GRATING INTERFEROMETRY; TEMPERATURE RESISTANT GRATINGS;

INTERFEROMETRY;

EID: 0028737805     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)