Evaluation of subpixel feature localization methods for precision measurement

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2350, Issue , 1994, Pages 229-238

  Valkenburg, Robert J ^a   McIvor, Alan M ^a   Power, P Wayne ^a  

^a CALLAGHAN INNOVATION   (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ESTIMATION; IMAGE PROCESSING; MEASUREMENT THEORY; SPURIOUS SIGNAL NOISE;

FEATURE EXTRACTION; PRECISION MEASUREMENT; VISION ALGORITHMS;

COMPUTER VISION;

EID: 0028737631     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)