Direct Visualization of Surfactant Hemimicelles by Force Microscopy of the Electrical Double Layer

Langmuir

Volumn 10, Issue 12, 1994, Pages 4409-4413

  Manne, S ^a,b   Cleveland, J P ^a,b,c   Gaub, H E ^a,b   Stucky, G D ^a,b,c   Hansma, P K ^a,b,c  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIRECT VISUALIZATION; ELECTRICAL DOUBLE LAYER; IONIC SURFACTANTS; SURFACTANT HEMIMICELLES;

IMAGING TECHNIQUES; MICELLES; MICROSCOPIC EXAMINATION; MORPHOLOGY;

SURFACE ACTIVE AGENTS;

EID: 0028736821     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la00024a003     Document Type: Article

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