Dynamic floating-body instabilities in partially depleted SOI CMOS circuits

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1994, Pages 661-664

  Suh, Dongwook ^a   Fossum, Jerry G ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; COMPUTER AIDED NETWORK ANALYSIS; COMPUTER SIMULATION; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC NETWORK PARAMETERS; HYSTERESIS; RANDOM ACCESS STORAGE; SEMICONDUCTOR DEVICE MODELS; SILICON ON INSULATOR TECHNOLOGY;

FLOATING BODY EFFECTS;

CMOS INTEGRATED CIRCUITS;

EID: 0028735418     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)