Preliminary characterisation of a new hybrid structure with CdTe: X-ray imaging capabilities

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2278, Issue , 1994, Pages 21-27

  Cuzin, Marc ^a   Glasser, Francis ^a   Mermet, Rene ^a   Meunier, Nathalie ^a   Peyret, Olivier ^a   Rambaud, Philippe ^a  

^a CEA LETI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM TELLURIDE; DETECTORS; ELECTRIC FIELDS; MICROMETERS; READOUT SYSTEMS; SILICON;

ABSORPTION EFFICIENCY; DIRECT ABSORPTION; HIGH SPATIAL RESOLUTION; HYBRID STRUCTURE; INTEGRATED AMPLIFIERS; READ-OUT CIRCUIT; SILICON CIRCUITS; STANDARD LITHOGRAPHIES;

THICKNESS MEASUREMENT;

EID: 0028732557     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.180024     Document Type: Conference Paper

References (0)