Time and frequency resolved investigation of thin film laser damage

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2114, Issue , 1994, Pages 366-380

  Welsch, E ^a   Mann, K ^b   Reichling, M ^c   Ettrich, K ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b LASER LABORATORIUM GÖTTINGEN E V   (Germany)

^c FREIE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ENVIRONMENTAL REGULATIONS; FREQUENCY DOMAIN ANALYSIS; NONDESTRUCTIVE EXAMINATION; OPTICAL COATINGS; OPTICAL MATERIALS; THERMOELASTICITY; COATINGS; DIELECTRIC MATERIALS; MATHEMATICAL MODELS; THIN FILMS; VACUUM;

DIELECTRIC COATINGS; FEMTOSECOND UV LASERS; HIGH-RESOLUTION MEASUREMENTS; MATHEMATICAL TREATMENTS; PHOTOTHERMAL DISPLACEMENT; THERMAL LOSS MECHANISMS; THERMOELASTIC MATERIALS; TIME AND FREQUENCIES;

LASER DAMAGE; LASER BEAM EFFECTS;

LASER DAMAGE; PHOTOTHERMAL DISPLACEMENT;

EID: 0028732516     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.180916     Document Type: Conference Paper

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