A New Technique for Measuring Coupling Coefficients and 3-D Capacitance Characterization of Floating-Gate Devices

IEEE Transactions on Electron Devices

Volumn 41, Issue 12, 1994, Pages 2337-2342

  Choi, Woong L ^a   Kim, Dae M ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER AIDED NETWORK ANALYSIS; CORRELATION METHODS; GATES (TRANSISTOR); MATHEMATICAL MODELS; PRODUCT DESIGN; SEMICONDUCTOR DEVICE STRUCTURES;

COUPLING COEFFICIENTS; FLOATING GATE DEVICES; THREE DIMENSIONAL CAPACITANCE CHARACTERIZATION;

NONVOLATILE STORAGE;

EID: 0028731423     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.337446     Document Type: Article

References (9)

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