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Volumn 1, Issue , 1994, Pages 241-244
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Investigation of parasitic effects in multi-transducer SAW RF filters
a
a
SIEMENS AG
(Germany)
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
COMPUTATIONAL COMPLEXITY;
COMPUTER SIMULATION;
ELECTRIC LOSSES;
ELECTRIC NETWORK TOPOLOGY;
FREQUENCIES;
MATHEMATICAL MODELS;
MATRIX ALGEBRA;
MEASUREMENT ERRORS;
NETWORK COMPONENTS;
ULTRASONIC DISTORTION;
ULTRASONIC TRANSDUCERS;
BOND WIRES;
CIRCUIT ELEMENTS;
CONNECTION PADS;
COUPLING CAPACITANCE;
FILTER GEOMETRY;
INDUCTIVE EFFECTS;
LUMPED ELEMENT CIRCUIT MODEL;
MULTITRANSDUCER SURFACE ACOUSTIC WAVE FILTERS;
OHMIC LOSSES;
PARASITIC EFFECTS;
ACOUSTIC SURFACE WAVE FILTERS;
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EID: 0028729143
PISSN: 10510117
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ultsym.1994.401587 Document Type: Conference Paper |
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Times cited : (6)
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References (8)
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