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Volumn , Issue , 1994, Pages 104-109
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Total-dose and SEU results for the AD8001, a high-performance commercial op-amp fabricated in a dielectrically-isolated, complementary-bipolar process
a
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Author keywords
[No Author keywords available]
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Indexed keywords
BIPOLAR TRANSISTORS;
DOSIMETRY;
ELECTRON DEVICE TESTING;
FABRICATION;
PERFORMANCE;
RADIATION;
RADIATION HARDENING;
SPACE APPLICATIONS;
SUBSTRATES;
SYSTEMS ANALYSIS;
BONDED WAFER SUBSTRATE;
DIELECTRICALLY ISOLATED COMPLEMENTARY BIPOLAR PROCESS;
RADIATION HARDNESS;
RADIATION TESTING;
SINGLE EVENT INDUCED LATCHUP;
SINGLE EVENT UPSET;
OPERATIONAL AMPLIFIERS;
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EID: 0028727976
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (9)
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References (4)
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