Analysis of GTO failure mode during DC voltage blocking

IEEE International Symposium on Power Semiconductor Devices & ICs

Volumn , Issue , 1994, Pages 221-225

  Matsuda, H ^a   Fujiwara, T ^a   Hiyoshi, M ^a   Nishitani, K ^a   Kuwako, A ^a   Ikehara, T ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; ELECTRIC WAVEFORMS; FAILURE ANALYSIS; LEAKAGE CURRENTS; SEMICONDUCTOR MATERIALS;

DIRECT VOLTAGE BLOCKING; FAILURE MODE;

THYRISTORS;

EID: 0028725320     PISSN: None     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (1)