Photoellipsometry characterization of AlGaAs/GaAs heterojunctions for solar cells

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn 2, Issue , 1994, Pages 1759-1763

  Xiong, Yi Ming ^a   Wong, Cheong Chee ^a   Saitoh, Tadashi ^a  

^a TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; DOPING (ADDITIVES); ELECTRIC FIELDS; ELLIPSOMETRY; MATHEMATICAL MODELS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SOLAR CELLS;

BROADENING EFFECTS; DOPING DENSITY; ELECTRIC-FIELD INDUCED CHANGES; FRANZ-KELDYSH THEORY; PHOTOELLIPSOMETRY; PHOTOREFLECTANCE; SPECTROSCOPIC ELLIPSOMETRY; SURFACE BUILT-IN ELECTRIC FIELD STRENGTH;

HETEROJUNCTIONS;

EID: 0028722934     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)