Evidence for Two Types of Radiation-Induced Trapped Positive Charge

IEEE Transactions on Nuclear Science

Volumn 41, Issue 6, 1994, Pages 1828-1834

  Freitag, R K ^a   Brown, D B ^a   Dozier, C M ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL DEFECTS; ELECTRIC VARIABLES MEASUREMENT; ENERGY GAP; GATES (TRANSISTOR); OXIDES; PARTICLE BEAM INJECTION; RADIATION EFFECTS; SEMICONDUCTING SILICON; SUBSTRATES; THERMAL EFFECTS;

HOLE TRAP; POSITIVE OXIDE CHARGE; X IRRADIATION;

CHARGE CARRIERS;

EID: 0028721232     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.340514     Document Type: Article

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