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Volumn , Issue , 1994, Pages 78-85
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Characterization of single event effects for the AD677, 16-bit A/D converter
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Author keywords
[No Author keywords available]
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Indexed keywords
CAMERAS;
CHARGE COUPLED DEVICES;
CMOS INTEGRATED CIRCUITS;
DIES;
ERRORS;
FABRICATION;
SPECTROMETERS;
TELESCOPES;
BICMOS PROCESS;
DIGITAL DIE;
DIGITAL TO ANALOG CONVERTER;
HUBBLE SPACE TELESCOPE;
SINGLE EVENT EFFECTS;
SINGLE EVENT UPSETS;
SPACE TELESCOPE IMAGING SPECTROGRAPH;
ANALOG TO DIGITAL CONVERSION;
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EID: 0028709928
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (13)
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References (5)
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