Preparation and properties of lanthanum modified PbTiO3 thin films by rf-magnetron sputtering

IEEE International Symposium on Applications of Ferroelectrics

Volumn , Issue , 1994, Pages 53-58

  Iijima, K ^a   Takeuchi, T ^a   Nagao, N ^a   Takayama, R ^a   Ueda, I ^a  

^a PANASONIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; FILM GROWTH; LANTHANUM; LEAD COMPOUNDS; MAGNESIA; MAGNETRON SPUTTERING; PYROELECTRICITY; SPECIMEN PREPARATION; X RAY DIFFRACTION;

C-AXIS ORIENTATION; DIFFRACTION PATTERNS; DIFFRACTOMETRY; PYROELECTRIC COEFFICIENT;

THIN FILMS;

EID: 0028707230     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)