Degradation of a-Si:H solar cells: new evidence for a bulk effect

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn 1, Issue , 1994, Pages 583-586

  Wyrsch, N ^a   Shah, A ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CURRENT VOLTAGE CHARACTERISTICS; DEFECTS; DEGRADATION; ELECTRIC FIELDS; ELECTRIC VARIABLES MEASUREMENT; INTERFACES (MATERIALS); LIGHT; MODIFICATION; PERFORMANCE;

BULK EFFECT; DEFECT DENSITY; INTRINSIC LAYER;

SOLAR CELLS;

EID: 0028706871     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)