New evaluation technique for thin-film solar cell back-reflector using photothermal deflection spectroscopy

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn 1, Issue , 1994, Pages 555-558

  Deng, Xunming ^a   Narasimhan, K L ^a  

^a Energy Conversion Devices Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH TEMPERATURE OPERATIONS; LIGHT ABSORPTION; LIGHT MEASUREMENT; LIGHT REFLECTION; LIGHT SCATTERING; LOW TEMPERATURE OPERATIONS; MIRRORS; QUANTUM EFFICIENCY; SILVER; SPECTROPHOTOMETERS; THIN FILMS;

OPTICAL LOSS; PHOTOTHERMAL DEFLECTION SPECTROSCOPY; REFLECTANCE MEASUREMENT; THIN FILMS SOLAR CELL BACK REFLECTOR;

SILICON SOLAR CELLS;

EID: 0028702286     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)