Mechanical wafer engineering for high efficiency solar cells: an investigation of the induced surface damage

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn 2, Issue , 1994, Pages 1347-1350

  Fath, P ^a   Willeke, G ^a   Bucher, E ^a   Szlufcik, J ^a   Murti, R M ^a   De Clercq, K ^a   Nijs, J ^a   Mertens, R ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EFFICIENCY; ELECTRON MICROSCOPY; ETCHING; GRAIN SIZE AND SHAPE; MICROWAVE MEASUREMENT; POLYCRYSTALLINE MATERIALS; SILICON WAFERS; SUBSTRATES; SURFACES; TEXTURES;

MECHANICAL STRUCTURING; MECHANICAL WAFER ENGINEERING; MICROWAVE REFLECTION LIFETIME MEASUREMENTS; SURFACE DAMAGE;

SILICON SOLAR CELLS;

EID: 0028702266     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)