Single event effects in analog-to-digital converters: Device performance and system impact

IEEE Transactions on Nuclear Science

Volumn 41, Issue 6, 1994, Pages 2187-2194

  Turflinger, T L ^a   Davey, M V ^a   Mappes, B M ^a  

^a NAVAL SURFACE WARFARE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; BIPOLAR SEMICONDUCTOR DEVICES; BIT ERROR RATE; CMOS INTEGRATED CIRCUITS; COMPUTATIONAL METHODS; CYCLOTRONS; IONIZATION OF SOLIDS; RADIATION EFFECTS; SEMICONDUCTOR DEVICE TESTING; SIGNAL INTERFERENCE;

ANALOG TO DIGITAL CONVERTERS; SINGLE EVENT EFFECTS;

CODE CONVERTERS;

EID: 0028699523     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.340561     Document Type: Article

References (5)

1. T. L. Turflinger and M. V. Davey, IEEE Trans. Nucl. Sci., Vol NS36, p2356, (1989).
2. T. L. Turflinger and M. V. Davey, IEEE Trans. Nucl. Sci., Vol NS37, p1832, (1990).
3. Analog Devices, Inc, 1994 Military/Aerospace Reference Manual, p6-51, p6-55.
4. MADCAT Tester, developed by Mission Research Corporation under contract to Crane Division, NSWC.
5. E. L. Petersen, J. C. Pickel, J. H. Adams, Jr., and E. C. Smith, IEEE Trans Nucl. Sci., Vol NS39, p1577, (1992).