Relationship between test coverage and reliability

Proceedings of the International Symposium on Software Reliability Engineering, ISSRE

Volumn , Issue , 1994, Pages 186-195

  Malaiya, Yashwant K ^a   Li, Naixin ^a   Bieman, Jim ^a   Karcich, Rick ^a   Skibbe, Bob ^a   Tek, Storage ^a  

^a Department of Ecosystem Science and Sustainability   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER APPLICATIONS; COMPUTER SYSTEMS; DATA STRUCTURES; ERROR CORRECTION; ERRORS; PROGRAM DEBUGGING; RELIABILITY;

DATA SETS; TEST COVERAGE;

COMPUTER SOFTWARE;

EID: 0028698748     PISSN: 10719458     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (31)