Identifying risk using ODC based growth models

Proceedings of the International Symposium on Software Reliability Engineering, ISSRE

Volumn , Issue , 1994, Pages 282-288

  Chillarege, Ram ^a   Biyani, Shriram ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CODES (STANDARDS); GRAPH THEORY; MATHEMATICAL MODELS; PRODUCT DESIGN; RELIABILITY; RISK ASSESSMENT; STABILITY; TESTING;

ORTHOGONAL DEFECT CLASSIFICATION BASED GROWTH MODELS; SOFTWARE RELIABILITY;

COMPUTER SOFTWARE;

EID: 0028698379     PISSN: 10719458     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)