Testability analysis and improvement from VHDL behavioral specifications

European Design Automation Conference - Proceedings

Volumn , Issue , 1994, Pages 644-649

  Gu, Xinli ^a   Kuchcinski, Krzysztof ^a   Peng, Zebo ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; COMPUTER AIDED LOGIC DESIGN; COMPUTER AIDED NETWORK ANALYSIS; DESIGN AIDS; DIGITAL INTEGRATED CIRCUITS; INTEGRATED CIRCUIT TESTING; LOGIC GATES; OPTIMIZATION; VLSI CIRCUITS;

REGISTER TRANSFER LEVEL; TEST PATTERN GENERATION; TESTABILITY ANALYSIS;

COMPUTER HARDWARE DESCRIPTION LANGUAGES;

EID: 0028697680     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)