A Radiation-Hardened 32-bit Microprocessor Based on the Commercial CMOS Process

IEEE Transactions on Nuclear Science

Volumn 41, Issue 6, 1994, Pages 2481-2486

  Yoshioka, Shinichi ^a   Kamimura, Hiroshi ^a   Akiyama, Masatsugu ^a   Nakamura, Mitsuhiro ^b   Tamura, Takashi ^b   Kuboyama, Satoshi ^b  

^a HITACHI LTD   (Japan)

^b JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CHARGE CARRIERS; CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENT CONTROL; HYDROGEN; INTERFACES (MATERIALS); LEAKAGE CURRENTS; OXIDES; RADIATION EFFECTS; SEMICONDUCTING SILICON COMPOUNDS; SILICON NITRIDE; SUBSTRATES;

NEGATIVE THRESHOLD VOLTAGE SHIFT; OXIDE TRAPPED HOLES; SILICON NITRIDE PASSIVATION LAYER;

MICROPROCESSOR CHIPS;

EID: 0028697672     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.340605     Document Type: Article

References (8)

1. T.P. Ma, P.V. Dressendorfer: Ionizing Radiation Effects in MOS Devices and Circuits, John Wiley & Sons, New York (1989).
2. H.M. Manasevit, W.I. Simpson: Single-Crystal Silicon on a Sapphire Substrate, J. Appl. Phys. Vol. 35, 1349 (1964).
3. C.W. Mueller, PH. Robinson: Grown-Film Silicon Transistors on Sapphire, Proc. IEEE, Vol. 52, 1487 (1964).
4. H. Kamimura, et al.: Development of MOS Transistors for Radiation-Hardened Large Scale Integrated Circuits and Analysis of Radiation-Induced Degradation, J. Nucl. Sci. Technol. Vol.31, 24 (1994).
5. R.E. Anderson: Post-gate Plasma and Sputter Process Effects on the Radiation Hardness of Metal Gate CMOS Integrated Circuits, IEEE Trans on NS, NS25, 1459 (1978).
6. A.G. Sabnis: Process Dependent Buildup of Interface States in Irradiated n-Channel MOSFETs, IEEE Trans on NS, NS32, 3905 (1985).
7. H. Kamimura, M. Sakagami: Prediction Method for Total Dose Effects on Complementary Metal Oxide Semiconductor Integrated Circuits Using Impulse Response Model for Threshold Voltage Shift, J. Nucl, Sci. Technol. Vol.28, 14 (1991).
8. TRON Associations: An Invitation to T-Open, TRON Associations, Tokyo (1992).