Fault dictionary compaction by output sequence removal

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn , Issue , 1994, Pages 576-579

  Boppana, Vamsi ^a   Fuchs, W Kent ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL CIRCUITS; SEQUENTIAL CIRCUITS; TREES (MATHEMATICS); VECTORS;

BENCHMARK CIRCUITS; FAULT DICTIONARY; OUTPUT SEQUENCE REMOVAL; OUTPUT SEQUENCES; SPECIFIC TEST VECTORS;

ELECTRIC FAULT LOCATION;

EID: 0028697172     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)